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Proceedings Paper

Optimum schemes for wavefront sensorless adaptive optics in microscopy
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Paper Abstract

In adaptive microscope systems, it is often desirable to dispense with the wavefront sensor and perform aberration correction through optimisation an appropriate quality metric, such as image brightness or sharpness. A sequence of trial aberrations is applied to the adaptive element and the metric values are calculated. The optimum aberration correction is derived from these measurements. An important choice in the design of these correction schemes is the modal aberration expansion. This choice may depend upon several factors, such as the deformable mirror, the optimisation metric, the aberration statistics or the image properties. We discuss these factors with particular reference to microscope imaging.

Paper Details

Date Published: 23 February 2009
PDF: 7 pages
Proc. SPIE 7209, MEMS Adaptive Optics III, 720904 (23 February 2009); doi: 10.1117/12.810512
Show Author Affiliations
Delphine Débarre, Univ. of Oxford (United Kingdom)
Biru Wang, Univ. of Oxford (United Kingdom)
Tony Wilson, Univ. of Oxford (United Kingdom)
Martin J. Booth, Univ. of Oxford (United Kingdom)

Published in SPIE Proceedings Vol. 7209:
MEMS Adaptive Optics III
Scot S. Olivier; Thomas G. Bifano; Joel A. Kubby, Editor(s)

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