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Proceedings Paper

Two-band DMD-based infrared scene simulator
Author(s): Julia Rentz Dupuis; David J. Mansur; Robert Vaillancourt; Thomas Evans; David Carlson; Elizabeth Schundler
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Paper Abstract

OPTRA is developing a two-band midwave infrared (MWIR) scene simulator based on digital micromirror device (DMD) technology; this simulator is intended for training various IR tracking systems that exploit the relative intensities of two separate MWIR spectral bands. Our approach employs two DMDs, one for each spectral band, and an efficient optical design which overlays the scenes reflected by each through a common telecentric projector lens. Other key components are a miniature thermal source and a series of dichroic beamsplitters. Through the use of pulse width modulation, we are able to control the relative intensities of objects simulated by the two channels thereby enabling realistic scene simulations of various targets and projectiles approaching the tracking system. Performance projections support radiant intensity levels, resolution, bandwidth, and scene durations that meet the requirements for a host of IR tracking test scenarios. In this paper we summarize the results of a breadboard design, build, and test which establishes the feasibility of our approach. We also present portions of the preliminary design of a prototype two-band simulator which will be built and tested over the next year.

Paper Details

Date Published: 13 February 2009
PDF: 11 pages
Proc. SPIE 7210, Emerging Digital Micromirror Device Based Systems and Applications, 72100J (13 February 2009); doi: 10.1117/12.809379
Show Author Affiliations
Julia Rentz Dupuis, OPTRA, Inc. (United States)
David J. Mansur, OPTRA, Inc. (United States)
Robert Vaillancourt, OPTRA, Inc. (United States)
Thomas Evans, OPTRA, Inc. (United States)
David Carlson, OPTRA, Inc. (United States)
Elizabeth Schundler, OPTRA, Inc. (United States)

Published in SPIE Proceedings Vol. 7210:
Emerging Digital Micromirror Device Based Systems and Applications
Larry J. Hornbeck; Michael R. Douglass, Editor(s)

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