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Proceedings Paper

Analysis of image quality for laser display scanner test
Author(s): H. Specht; S. Kurth; D. Billep; T. Gessner
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Paper Abstract

The scanning laser display technology is one of the most promising technologies for highly integrated projection display applications (e. g. in PDAs, mobile phones or head mounted displays) due to its advantages regarding image quality, miniaturization level and low cost potential. As a couple of research teams found during their investigations on laser scanning projections systems, the image quality of such systems is - beside from laser source and video signal processing - crucially determined by the scan engine, including MEMS scanner, driving electronics, scanning regime and synchronization. Even though a number of technical parameters can be measured with high accuracy, the test procedure is challenging because the influence of these parameters on image quality is often insufficiently understood. Thus, in many cases it is not clear how to define limiting values for characteristic parameters. In this paper the relationship between parameters characterizing the scan engine and their influence on image quality will be discussed. Those include scanner topography, geometry of the path of light as well as trajectory parameters. Understanding this enables a new methodology for testing and characterization of the scan engine, based on evaluation of one or a series of projected test images. Due to the fact that the evaluation process can be easily automated by digital image processing this methodology has the potential to become integrated into the production process of laser displays.

Paper Details

Date Published: 9 February 2009
PDF: 11 pages
Proc. SPIE 7206, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII, 72060G (9 February 2009); doi: 10.1117/12.808674
Show Author Affiliations
H. Specht, Fraunhofer ENAS (Germany)
S. Kurth, Fraunhofer ENAS (Germany)
D. Billep, Fraunhofer ENAS (Germany)
T. Gessner, Fraunhofer ENAS (Germany)

Published in SPIE Proceedings Vol. 7206:
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
Richard C. Kullberg; Rajeshuni Ramesham, Editor(s)

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