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Proceedings Paper

Modeling inversion in an ytterbium-doped fiber
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Paper Abstract

Accuracy at which population inversion in an ytterbium-doped fiber can be determined by modeling is studied. Here inversion refers to the percentage of ions excited to a higher energy level by the various optical fields. Knowledge of rare-earth ion inversion is crucial for determining the photodarkening behavior of a fiber, but can also be used to study the gain and noise properties of amplifiers. Sample fibers are first characterized for their optical and mechanical properties (e.g. absorption and fluorescence spectrum, excited state lifetime, rare-earth concentration and geometrical dimensions). Fiber specific absorption and emission cross-sections are then derived from the measured fiber parameters. Two methods (i.e. McCumber theory and Fuchtbauer-Ladenburg relation) are used to determine the detailed shape and the relative level of absorption to emission at different wavelengths. A full numerical model is used to simulate both core and cladding pumped YDFs. In order to validate the inversion results produced by the simulator a comparison between the measured and simulated ASE spectra is made. Sensitivity of the simulated ASE spectrum on the different parameters is investigated. Uncertainty analysis is made to show the contributions of various measured parameters on the uncertainty of the inversion. The principal contributor of uncertainty on the inversion was found to be the cross-section values.

Paper Details

Date Published: 6 February 2009
PDF: 8 pages
Proc. SPIE 7212, Optical Components and Materials VI, 721209 (6 February 2009); doi: 10.1117/12.807820
Show Author Affiliations
A. Iho, Helsinki Univ. of Technology (Finland)
M. Söderlund, Helsinki Univ. of Technology (Finland)
J. Montiel i Ponsoda, Helsinki Univ. of Technology (Finland)
J. Koponen, nLIGHT Corp. (Finland)
S. Honkanen, Helsinki Univ. of Technology (Finland)

Published in SPIE Proceedings Vol. 7212:
Optical Components and Materials VI
Shibin Jiang; Michel J. F. Digonnet; John W. Glesener; J. Christopher Dries, Editor(s)

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