Detailed reliability studies of high-power, CW, broad-area, GaAs-based laser- diodes were performed. Optical and electrical transients occurring prior to device failure by catastrophic optical-damage (COD) were observed. These transients were correlated with COD formation as observed in laser diodes with an optical window in the n-side electrode. In addition, custom electronics were designed to fault-protect the laser diodes during aging tests, i.e. each time a transient (fault) was detected, the operating current was temporarily cut off within 4μs of fault detection. The lifetime of fault-protected 808-nm laser-diode bars operated at a constant current of 120A (~130W) and 35°C exceeded similar unprotected devices by factors of 2.

Date Published: 23 February 2009
PDF: 10 pages
Proc. SPIE 7198, High-Power Diode Laser Technology and Applications VII, 719815 (23 February 2009); doi: 10.1117/12.807717

Published in SPIE Proceedings Vol. 7198:
High-Power Diode Laser Technology and Applications VII
Mark S. Zediker, Editor(s)