Proceedings Paper
Analysis of resolution for two display methods based on integral photography| Format | Member Price | Non-Member Price |
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Paper Abstract
Integral photography (IP) technology provides a method for recording and display of 3-dimensional scenes. In this paper,
we analyzed the relation between the resolution of an image capturing and the optical parameters of the system. The final
resolution of the image that the observer actually views is derived; the resolution limitation and the viewing area of the
integral photography are discussed. Theoretical analyses of the technology have shown that the integral photography (IP)
can produce image at great distance with the same resolution as conventional 2-D displays.
Paper Details
Date Published: 13 October 2008
PDF: 6 pages
Proc. SPIE 7129, Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration, 712905 (13 October 2008); doi: 10.1117/12.807373
Published in SPIE Proceedings Vol. 7129:
Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration
Jiancheng Fang; Zhongyu Wang, Editor(s)
PDF: 6 pages
Proc. SPIE 7129, Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration, 712905 (13 October 2008); doi: 10.1117/12.807373
Show Author Affiliations
Zhongbao Xu, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quantity Engineering (China)
Shuang Zhang, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quantity Engineering (China)
Key Lab. of Modern Manufacturing Quantity Engineering (China)
Shuang Zhang, Hubei Univ. of Technology (China)
Key Lab. of Modern Manufacturing Quantity Engineering (China)
Jun Yi, Hubei Univ. of Technology (China)
Published in SPIE Proceedings Vol. 7129:
Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration
Jiancheng Fang; Zhongyu Wang, Editor(s)
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