
Proceedings Paper
Image fusion and its real-time processing in dual-band infrared night vision systemFormat | Member Price | Non-Member Price |
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Paper Abstract
MWIR and LWIR are normally used in night vision system. A pseudo-color dual-band infrared image fusion algorithm is
proposed in this paper based on image features in wavelet domain. After wavelet decomposed from source images, edge
features are extracted from each low frequency component. The fusion rules are defined by the edge information, using
local modulus maxima rule for edge pixels and its sub-band neighboring pixels, and weighted mean coefficient rule for
non-edge pixels. Fusion result is mapped into pseudo-color image using special color look-up table in YUV color space.
The embedded fusion system used in night vision system is designed by TI multi-media processor DM642, and the
algorithm is validated on this platform. The experiments show that fusion result has good visual effect, and also has good
performance on the objective evaluation and anti-noise ability.
Paper Details
Date Published: 28 January 2009
PDF: 9 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562P (28 January 2009); doi: 10.1117/12.807341
Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
Yunlong Sheng; Yongtian Wang; Lijiang Zeng, Editor(s)
PDF: 9 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71562P (28 January 2009); doi: 10.1117/12.807341
Show Author Affiliations
Qingwang Qin, Beijing Institute of Technology (China)
Kun Gao, Beijing Institute of Technology (China)
Kun Gao, Beijing Institute of Technology (China)
Guoqiang Ni, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
Yunlong Sheng; Yongtian Wang; Lijiang Zeng, Editor(s)
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