Share Email Print
cover

Proceedings Paper

High-speed sequential image acquisition using a CMOS image sensor with a multi-lens optical system and its application for three-dimensional measurement
Author(s): Daisuke Miyazaki; Hiroki Shimizu; Yoshizumi Nakao; Takashi Toyoda; Yasuo Masaki
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A novel technique for acquiring time-sequential images during a frame-capture period of an ordinary CMOS image sensor using a multi-lens optical system is proposed. In addition, this system is utilized for high-speed three-dimensional measurement based on a spatial encoding method. In the proposed image capturing system, multiple lenses are rhomboidally arranged on a CMOS image sensor to detect multiple images for one object. Because pixel values in the CMOS image sensor are obtained sequentially, we can obtain multiple images that are captured at different timing. In the spatial encoding method, several kinds of optical patterns are projected to a measured object. It is possible to obtain multiple images in which different patterns are projected to the object within one frame period by dividing the captured images and reconstruct images from rearrange the parts of image. The principle of the proposed method was verified by three-dimensional measurement with a CMOS compound-eye image capturing. The size of the three-dimensional image was 360 x 270 pixel, and the number of steps of distance was 64, and the measurement time was 1/15 seconds.

Paper Details

Date Published: 27 January 2009
PDF: 8 pages
Proc. SPIE 7249, Sensors, Cameras, and Systems for Industrial/Scientific Applications X, 72490T (27 January 2009); doi: 10.1117/12.807189
Show Author Affiliations
Daisuke Miyazaki, Osaka City Univ. (Japan)
Hiroki Shimizu, Osaka City Univ. (Japan)
Yoshizumi Nakao, Funai Electric Co., Ltd. (Japan)
Takashi Toyoda, Funai Electric Co., Ltd. (Japan)
Yasuo Masaki, Funai Electric Co., Ltd. (Japan)


Published in SPIE Proceedings Vol. 7249:
Sensors, Cameras, and Systems for Industrial/Scientific Applications X
Erik Bodegom; Valérie Nguyen, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray