
Proceedings Paper
Study on activity measurement of [i]Nostoc flagelliforme[/i] cells based on color identificationFormat | Member Price | Non-Member Price |
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Paper Abstract
In order to measure the activities of Nostoc flagelliforme cells, a new method based on color identification was proposed
in this paper. N. flagelliforme cells were colored with fluoreseein diaeetate. Then, an image of colored N. flagelliforme
cells was taken, and changed from RGB model to HIS model. Its histogram of hue H was calculated, which was used as
the input of a designed BP network. The output of the BP network was the description of measured activity of N.
flagelliforme cells. After training, the activity of N. flagelliforme cells was identified by the BP network according to the histogram of H of their colored image. Experiments were conducted with satisfied results to show the feasibility and
usefulness of activity measurement of N. flagelliforme cells based on color identification.
Paper Details
Date Published: 2 February 2009
PDF: 6 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600Y (2 February 2009); doi: 10.1117/12.807043
Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)
PDF: 6 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600Y (2 February 2009); doi: 10.1117/12.807043
Show Author Affiliations
Yizhong Wang, Tianjin Univ. of Science and Technology (China)
Jianyu Su, Ningxia Univ. (China)
Tiegen Liu, Tianjin Univ. (China)
Jianyu Su, Ningxia Univ. (China)
Tiegen Liu, Tianjin Univ. (China)
Fanzhi Kong, Tianjin Univ. of Science and Technology (China)
Shiru Jia, Tianjin Key Lab.of Industry Microbiology (China)
Shiru Jia, Tianjin Key Lab.of Industry Microbiology (China)
Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)
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