Share Email Print

Proceedings Paper

The noise measurement and analysis system of optoelectronic coupled devices based on virtual instrument
Author(s): Yufeng Li; Qiuzhan Zhou
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Recent research results show that the low-frequency noise of optoelectronic coupled devices has become an important sensitive parameter affecting its operational status and reliability. Screening optoelectronic coupled devices is an effective method by measuring the noise power spectrum. However, this method is based on the traditional Fourier analysis and spectrum analysis, its measuring speed is quite slow, and the method used to establish screening threshold is more complicated. In this paper, a set of measurement and analysis system based on virtual instrument is set up, which is composed of dual-channel low-noise pre-amplifiers, dynamic signal analyzer Agilent35670A and PC. According to the wavelet analysis method, the different kinds of noise can be identified. Through the GPIB control, separating the 1/f noise, the g-r noise and the burst noise is performed and the noise analysis process is finished by the LabVIEW procedure. Experimental results demonstrate that this system can not only improve reliability of screening device to satisfy higher reliability and quality requirement, but also the testing and analyzing process is finished faster and more accurately than the traditional method.

Paper Details

Date Published: 28 January 2009
PDF: 5 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 715629 (28 January 2009); doi: 10.1117/12.806969
Show Author Affiliations
Yufeng Li, Shenyang Institute of Aeronautical Engineering (China)
Qiuzhan Zhou, Jilin Univ. (China)

Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
Yunlong Sheng; Yongtian Wang; Lijiang Zeng, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?