Proceedings Paper
Phase interrogation of a planar integrated refractive index sensor| Format | Member Price | Non-Member Price |
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Paper Abstract
A novel theoretical scheme is presented for a surface plasmon-polariton (SPP) planar refractive index sensor based on
one of the simplest integrated optical devices available, the Mach-Zehnder interferometer (MZI), to monitor relative
phase variations in waveguides. An SPP is excited with the Bragg grating imprinted into core and buffer layers of one of
the arms of the MZI. The main principle of operation of this device is based on the large phase change of the waveguide
mode transmitted through the grating during the SPP excitation caused by the change in the refractive index of the
sensed layer in contact with the SPP supporting metal layer.
Paper Details
Date Published: 12 August 2008
PDF: 5 pages
Proc. SPIE 7099, Photonics North 2008, 709926 (12 August 2008); doi: 10.1117/12.806853
Published in SPIE Proceedings Vol. 7099:
Photonics North 2008
Réal Vallée; Michel Piché; Peter Mascher; Pavel Cheben; Daniel Côté; Sophie LaRochelle; Henry P. Schriemer; Jacques Albert; Tsuneyuki Ozaki, Editor(s)
PDF: 5 pages
Proc. SPIE 7099, Photonics North 2008, 709926 (12 August 2008); doi: 10.1117/12.806853
Show Author Affiliations
Galina Nemova, École Polytechnique de Montréal (Canada)
Andrei V. Kabashin, École Polytechnique de Montréal (Canada)
Andrei V. Kabashin, École Polytechnique de Montréal (Canada)
Raman Kashyap, École Polytechnique de Montréal (Canada)
Published in SPIE Proceedings Vol. 7099:
Photonics North 2008
Réal Vallée; Michel Piché; Peter Mascher; Pavel Cheben; Daniel Côté; Sophie LaRochelle; Henry P. Schriemer; Jacques Albert; Tsuneyuki Ozaki, Editor(s)
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