
Proceedings Paper
Application of OTF instrument in the fabrication and assembling of aspheric lensFormat | Member Price | Non-Member Price |
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Paper Abstract
OTF reflects the frequency characteristic of optical system and is the key parameter that evaluates the imaging
quality of aerospace optical lens. The aspherics make the optical system simplified in structure with the imaging
quality assured at the mean time, however the assembling technology of aspheric optical system is restricted
because the fabrication technology is difficult and a lack of testing means. In this paper, means of OTF testing is
adopted and a testing frock clamp is designed and processed to test the OTF of aspherics during its fabrication, and
the result of test is used to supervise the fabrication until meet its target. During the assembling of the aspheric lens,
the source of aberration that affects the imaging, which is used to supervise the next assembling, is analyzed
according to the test result of OTF instrument, and test the OTF of re-assembling aspheric lens another time to see
whether the result is meet the request, then the assembling will be accomplished. The result of experiment shows
that it is feasible to supervise the fabrication and assembling of aspheric optical system by OTF instrument.
Paper Details
Date Published: 2 February 2009
PDF: 6 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600E (2 February 2009); doi: 10.1117/12.806518
Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)
PDF: 6 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71600E (2 February 2009); doi: 10.1117/12.806518
Show Author Affiliations
Xiaoxiao Wei, Soochow Univ. (China)
Jianjun Yu, Soochow Univ. (China)
Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)
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