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Proceedings Paper

Evaluating laser range scanner lateral resolution in 3D metrology
Author(s): David MacKinnon; J. Angelo Beraldin; Luc Cournoyer; Francois Blais
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Paper Abstract

In this study, laser range scanner lateral resolution is investigated for laser range scanners. A standardized method is proposed and demonstrated for quantifying the lateral surface resolvability of a laser range scanner through the use of an appropriately-designed artefact. A new metric for lateral surface resolution, the limit of surface resolvability, is presented and is obtained using what is referred to as the wedge test. The results of applying this metrics using this test method to laser range scanners is also presented.

Paper Details

Date Published: 19 January 2009
PDF: 11 pages
Proc. SPIE 7239, Three-Dimensional Imaging Metrology, 72390P (19 January 2009); doi: 10.1117/12.805868
Show Author Affiliations
David MacKinnon, National Research Council of Canada (Canada)
J. Angelo Beraldin, National Research Council of Canada (Canada)
Luc Cournoyer, National Research Council of Canada (Canada)
Francois Blais, National Research Council of Canada (Canada)

Published in SPIE Proceedings Vol. 7239:
Three-Dimensional Imaging Metrology
J. Angelo Beraldin; Geraldine S. Cheok; Michael McCarthy; Ulrich Neuschaefer-Rube D.V.M., Editor(s)

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