Share Email Print

Proceedings Paper

Low Gr/Gb sensitivity imbalance 3.2M CMOS image sensor with 2.2µm pixel
Author(s): Nagataka Tanaka; Junji Naruse; Ikuko Inoue; Hirofumi Yamashita; Makoto Monoi
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

For CMOS image sensors with pixel size under 3μm pixel, the pixel architecture in which several photodiodes share floating diffusion and transistors tends to be adopted in order to improve full well capacity and sensitivity. In spite even in the aforementioned advantage, adoption of the architecture may result in sensitivity imbalance between the shared photodiodes. On reproduced images obtained by the shared pixel architecture, sensitivity imbalance between Gr and Gb photodiodes in Bayer CFA is often conspicuous, because the imbalance results in horizontal pattern noise. We developed a low Gr/Gb sensitivity imbalance 3.2M CMOS Image Sensor with 2.2μm pixel. The pixel has the structure which is optically designed carefully in order to prevent light diffraction in pixel. According to a simulation result, read transistor gate for pixels with red color filter has an edgeless layout, because longer wave length light incident to the red pixels. For the optical design, electromagnetic analytical simulation was used because wave-optical effect cannot be ignored for the small pixel below 3μm. Gr/Gb sensitivity imbalance was measured for both the developed sensor and conventional sensor in visible light range. It was measured that the Gr/Gb sensitivity imbalance is below measurement limit.

Paper Details

Date Published: 27 January 2009
PDF: 7 pages
Proc. SPIE 7249, Sensors, Cameras, and Systems for Industrial/Scientific Applications X, 72490E (27 January 2009); doi: 10.1117/12.805849
Show Author Affiliations
Nagataka Tanaka, Toshiba Corp. (Japan)
Junji Naruse, Toshiba Corp. (Japan)
Ikuko Inoue, Toshiba Corp. (Japan)
Hirofumi Yamashita, Toshiba Corp. (Japan)
Makoto Monoi, Toshiba Corp. (Japan)

Published in SPIE Proceedings Vol. 7249:
Sensors, Cameras, and Systems for Industrial/Scientific Applications X
Erik Bodegom; Valérie Nguyen, Editor(s)

© SPIE. Terms of Use
Back to Top