
Proceedings Paper
Accurate high reflectivity measurement based on a novel optical feedback cavity ring-down techniqueFormat | Member Price | Non-Member Price |
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Paper Abstract
Highly reflective mirrors have been widely used in high power lasers, laser gyros, and gravitational-wave detection, etc.
However, reliable measurement of high reflectivity (R>99.99%) is difficult. In this paper a novel optical feedback cavity
ring-down technique (OF-CRD) by re-injecting the strong optical feedback from the ring-down cavity (RDC) into the
oscillator cavity of a Fabry-Perot diode laser is developed for the ultra-high reflectivity measurement. The laser line is
narrowed and occasionally in resonance with one or more ring-down cavity modes. The amplitude of the RDC output
signal is enhanced by a factor of over two orders of magnitude, compared with the conventional phase-shift CRD
technique. Four pairs of cavity mirrors with different reflectivity are used to investigate the sensitivity and
reproducibility of the OF-CRD technique. The accuracy is greatly enhanced from about 0.003% to 0.00003% as the
reflectivity of cavity mirrors increases from about 99.8% to 99.996%. A folded RDC with cavity length of 70cm is
constructed by inserting a planar test mirror into the linear RDC and the reflectivity of the test mirror is statistically
determined to be 99.9526±0.0004%. The OF-CRD is simple, reliable, highly-sensitive and cost efficient.
Paper Details
Date Published: 30 December 2008
PDF: 10 pages
Proc. SPIE 7132, Laser-Induced Damage in Optical Materials: 2008, 71320U (30 December 2008); doi: 10.1117/12.804178
Published in SPIE Proceedings Vol. 7132:
Laser-Induced Damage in Optical Materials: 2008
Gregory J. Exarhos; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)
PDF: 10 pages
Proc. SPIE 7132, Laser-Induced Damage in Optical Materials: 2008, 71320U (30 December 2008); doi: 10.1117/12.804178
Show Author Affiliations
Yuan Gong, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Bincheng Li, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Bincheng Li, Institute of Optics and Electronics (China)
Yanling Han, Institute of Optics and Electronics (China)
Mingqiang Liu, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Mingqiang Liu, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Published in SPIE Proceedings Vol. 7132:
Laser-Induced Damage in Optical Materials: 2008
Gregory J. Exarhos; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)
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