
Proceedings Paper
Emission of biased green quantum wells in time and wavelength domainFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Carrier lifetime and efficiency droop of green light emitting InGaN QWs in LEDs and laser diodes (LD) are
discussed in term of Shockley-Read-Hall, radiative, and Auger-like recombination. The carrier lifetime, spectral
shift, and carrier density as function of current density was measured by time-resolved electroluminescence with
a streak camera. The current density was varied from very low for the LEDs to threshold for the LD. The
transition from spontaneous emission in the low carrier density regime to stimulated emission in the high carrier
regime is continuous. A comparison with Hakki-Paoli optical gain spectra provides evidence for a significant
contribution of stimulated emission already at intermediate current densities. Stimulated emission is discussed
as possible contribution to efficiency droop. A wavelength dependency of the lifetime is certainly caused by
stimulated emission. Slope efficiency of the laser diode provides a lower limit for the injection efficiency of the
LD. Time-resolved electroluminescence spectroscopy with applied bias demonstrates the variation of radiative
recombination and consequently carrier lifetime with applied bias. Under certain conditions for modulated
operation more light is emitted during times of zero bias than during forward bias.
Paper Details
Date Published: 16 February 2009
PDF: 13 pages
Proc. SPIE 7216, Gallium Nitride Materials and Devices IV, 72161U (16 February 2009); doi: 10.1117/12.803932
Published in SPIE Proceedings Vol. 7216:
Gallium Nitride Materials and Devices IV
Hadis Morkoç; Cole W. Litton; Jen-Inn Chyi; Yasushi Nanishi; Joachim Piprek; Euijoon Yoon, Editor(s)
PDF: 13 pages
Proc. SPIE 7216, Gallium Nitride Materials and Devices IV, 72161U (16 February 2009); doi: 10.1117/12.803932
Show Author Affiliations
Ulrich T. Schwarz, Regensburg Univ. (Germany)
Published in SPIE Proceedings Vol. 7216:
Gallium Nitride Materials and Devices IV
Hadis Morkoç; Cole W. Litton; Jen-Inn Chyi; Yasushi Nanishi; Joachim Piprek; Euijoon Yoon, Editor(s)
© SPIE. Terms of Use
