
Proceedings Paper
How to design an easily deposited multi-band-pass filterFormat | Member Price | Non-Member Price |
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Paper Abstract
A systemic design on multi-bandpass filters is developed based on a plurality of Fabry-Perot(FP) interferometers, which
are composed of a cavity between mirrors. Certain number of passbands can be built by selecting the number of cavities,
while the band-width and the band- interval can be adjusted by the total layers contained in mirrors. By changing the
configuration of mirrors and cavities a huge group of multi-band-pass filter will be developed. Among many multi-bandpass
filters given here several of them are tested. A double-passband filter is deposited on a super-thin substrate of
thickness about 5 μm. One of its passbands situates 1550nm, three rejection bands situate 1310nm, 1490nm and 1640nm
make this filter very useful for B-PON and GE-PON in the fiber communications. A triple-bandpass filter with four
rejected bands is deposited on glass, its high transmittance in passbands and high isolation in rejection band make it a
valuable filter for Add/Drop device. In another deposition its three passbands can transmit blue, green and red (B, G and
R) lights but reject other lights which otherwise become noise to the B, G and R light signals. The good performances of
the filters deposited above prove that multi-bandpass filter designed by this way is easy to do.
Paper Details
Date Published: 11 November 2008
PDF: 8 pages
Proc. SPIE 7134, Passive Components and Fiber-based Devices V, 713432 (11 November 2008); doi: 10.1117/12.803710
Published in SPIE Proceedings Vol. 7134:
Passive Components and Fiber-based Devices V
Ming-Jun Li; Ping Shum; Ian H. White; Xingkun Wu, Editor(s)
PDF: 8 pages
Proc. SPIE 7134, Passive Components and Fiber-based Devices V, 713432 (11 November 2008); doi: 10.1117/12.803710
Show Author Affiliations
Sho Kamikawa, Koshin-Kogaku Co., Ltd. (Japan)
Published in SPIE Proceedings Vol. 7134:
Passive Components and Fiber-based Devices V
Ming-Jun Li; Ping Shum; Ian H. White; Xingkun Wu, Editor(s)
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