
Proceedings Paper
The Gaia challenge: testing high performance CCDs in large quantitiesFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Gaia, funded by ESA with EADS Astrium as the prime contractor, is an ambitious space observatory designed to
measure the positions of around one billion stars with unprecedented accuracy and is currently planned for launch in
2011. The Gaia instrument will feature a focal plane containing 106 large area CCD91-72s manufactured by e2v
technologies. This will be the largest CCD focal plane ever flown in space covering an area of 0.286m2. To ensure that
the devices meet the required high specification, they undergo significant testing before being accepted by the end user.
This involves geometrical, mechanical, environmental, endurance, electrical and electro-optical testing. With the flight
phase contract for Gaia requiring the delivery of 130 flight grade devices (plus another 40 engineering devices of
various grades), the volume of testing is an order of magnitude greater than and of similar timescale to, the typical space
programmes e2v technologies are involved with. This paper will begin by providing an overview of the Gaia mission
and the custom CCD91-72 that e2v technologies have designed for it. Next the various phases of the Gaia programme
will be outlined and how e2v approached the test requirements for each stage. Problems encountered, lessons learned,
and technical and logistical solutions implemented at each stage will be presented, to discuss how e2v technologies
improved the quality of the test data whilst reducing the test times. There will be particular emphasis on the electro-optical
testing and the test cameras on which this is performed.
Paper Details
Date Published: 9 October 2008
PDF: 15 pages
Proc. SPIE 7106, Sensors, Systems, and Next-Generation Satellites XII, 71061H (9 October 2008); doi: 10.1117/12.802953
Published in SPIE Proceedings Vol. 7106:
Sensors, Systems, and Next-Generation Satellites XII
Roland Meynart; Steven P. Neeck; Haruhisa Shimoda; Shahid Habib, Editor(s)
PDF: 15 pages
Proc. SPIE 7106, Sensors, Systems, and Next-Generation Satellites XII, 71061H (9 October 2008); doi: 10.1117/12.802953
Show Author Affiliations
Andrew Walker, e2v technologies (United Kingdom)
Tim Eaton, e2v technologies (United Kingdom)
Roy Steward, e2v technologies (United Kingdom)
John Turton, e2v technologies (United Kingdom)
Anthony Knoepfle, e2v technologies (United Kingdom)
Tom Wynne, e2v technologies (United Kingdom)
Tim Eaton, e2v technologies (United Kingdom)
Roy Steward, e2v technologies (United Kingdom)
John Turton, e2v technologies (United Kingdom)
Anthony Knoepfle, e2v technologies (United Kingdom)
Tom Wynne, e2v technologies (United Kingdom)
Peter Gillespie, e2v technologies (United Kingdom)
Alastair Curnock, e2v technologies (United Kingdom)
David Cooper, e2v technologies (United Kingdom)
Arwel Evans, e2v technologies (United Kingdom)
Matt Watcham, e2v technologies (United Kingdom)
Alastair Curnock, e2v technologies (United Kingdom)
David Cooper, e2v technologies (United Kingdom)
Arwel Evans, e2v technologies (United Kingdom)
Matt Watcham, e2v technologies (United Kingdom)
Published in SPIE Proceedings Vol. 7106:
Sensors, Systems, and Next-Generation Satellites XII
Roland Meynart; Steven P. Neeck; Haruhisa Shimoda; Shahid Habib, Editor(s)
© SPIE. Terms of Use
