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Proceedings Paper

Study of responsiveness of near-field terahertz imaging probes
Author(s): M. Berta; F. Kadlec
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Paper Abstract

We report on recent measurements and analysis performed with a metal-dielectric near-field terahertz probe. The images obtained with the near-field probe have been decomposed using factor analysis. Components corresponding to the dielectric properties of investigated samples and to the distance of the probe and of the sample have been identified. We further employed the probe for investigation of local anisotropy in a BaTiO3 crystal.

Paper Details

Date Published: 2 October 2008
PDF: 6 pages
Proc. SPIE 7117, Millimetre Wave and Terahertz Sensors and Technology, 71170A (2 October 2008); doi: 10.1117/12.800207
Show Author Affiliations
M. Berta, Institute of Physics (Czech Republic)
F. Kadlec, Institute of Physics (Czech Republic)

Published in SPIE Proceedings Vol. 7117:
Millimetre Wave and Terahertz Sensors and Technology
Keith A. Krapels; Neil A. Salmon, Editor(s)

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