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Proceedings Paper

Correction of reflectance characteristics of chosen natural and anthropogenic materials for an airborne laser scanning system
Author(s): Miroslawa Kaszczuk; Marek Zygmunt; Jadwiga Mierczyk
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Paper Abstract

In the work, analyses of chosen materials were presented in order to analyze the possibility of development of a laser scanning system. One showed results of research and analyses of data related to reflection characteristics of various materials with consideration of different ranks of composition and structure complication. Analyses were carried out for three wavelengths of electromagnetic radiation: λ1 = 850 nm, λ2 = 900 nm, λ3 = 1500 nm in reference to both natural and anthropogenic materials. The influence of atmospheric extinction on values of received proportions of signals for the chosen wavelengths was investigated and the method of signal correction was compiled. Correction was made taking into account character of reflection obtained from materials, various atmospheric conditions stated by the atmospheric visibility, and spectral characteristics of the atmospheric extinction. The proposed method of atmospheric extinction correction provides minimization of real values falsification and decrease in obtained measurement errors, which does not exceed the value of 5% for the analyses from a distance of 0.5 km with atmospheric visibility of 10 km, and for the analyses from a distance of 1 km with atmospheric visibility of 20 km.

Paper Details

Date Published: 14 October 2008
PDF: 10 pages
Proc. SPIE 7110, Remote Sensing for Environmental Monitoring, GIS Applications, and Geology VIII, 71101Y (14 October 2008); doi: 10.1117/12.800112
Show Author Affiliations
Miroslawa Kaszczuk, Military Univ. of Technology (Poland)
Marek Zygmunt, Military Univ. of Technology (Poland)
Jadwiga Mierczyk, Military Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 7110:
Remote Sensing for Environmental Monitoring, GIS Applications, and Geology VIII
Ulrich Michel; Daniel L. Civco; Manfred Ehlers; Hermann J. Kaufmann, Editor(s)

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