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Proceedings Paper

The influence of sea fog inhomogeneity on its microphysical characteristics retrieval
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Paper Abstract

A study on the effect of sea fog inhomogeneity on its microphysical parameters retrieval is presented. On the condition that the average liquid water content is linear vertically and the power spectrum spectral index sets 2.0, we generate a 3D sea fog fields by controlling the total liquid water contents greater than 0.04g/m3 based on the iterative method for generating scaling log-normal random field with an energy spectrum and a fragmentized cloud algorithm. Based on the fog field, the radiance at the wavelengths of 0.67 and 1.64 μm are simulated with 3D radiative transfer model SHDOM, and then the fog optical thickness and effective particle radius are simultaneously retrieved using the generic look-up-table AVHRR cloud algorithm. By comparing those fog optical thickness and effective particle radius, the influence of sea fog inhomogeneity on its properties retrieval is discussed. It exhibits the system bias when inferring sea fog physical properties from satellite measurements based on the assumption of plane parallel homogeneous atmosphere. And the bias depends on the solar zenith angel. The optical thickness is overrated while the effective particle radius is under-estimated at two solar zenith angle 30° and 60°. Those results show that it is necessary for sea fog true characteristics retrieval to develop a new algorithm using the 3D radiative transfer.

Paper Details

Date Published: 13 October 2008
PDF: 8 pages
Proc. SPIE 7107, Remote Sensing of Clouds and the Atmosphere XIII, 71070J (13 October 2008); doi: 10.1117/12.799697
Show Author Affiliations
Zengzhou Hao, State Oceanic Administration (China)
Delu Pan, State Oceanic Administration (China)
Fang Gong, State Oceanic Administration (China)
Xianqiang He, State Oceanic Administration (China)

Published in SPIE Proceedings Vol. 7107:
Remote Sensing of Clouds and the Atmosphere XIII
Richard H. Picard; Adolfo Comeron; Klaus Schäfer; Aldo Amodeo; Michiel van Weele, Editor(s)

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