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Proceedings Paper

Synthesis and study of structure and nonlinear optical properties of silicon carbide nanocrystal films
Author(s): A. Borshch; M. Brodyn; V. Volkov; V. Lyakhovetski; V. Rudenko; A. Semenov; V. Pusikov
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Paper Abstract

Nonlinear refraction has been for the first time studied in silicon carbide nanocrystal films synthesized by new technique of direct carbide and silicon ion deposition with ion energy of 100eV and low substrate temperature from 900°C to 1150°C. The films were shown to exhibit large optical nonlinear cubic susceptibility χ(3) ≅ 10-6 esu (λ=1064nm and λ=532nm, τи = 10ns).

Paper Details

Date Published: 25 September 2008
PDF: 5 pages
Proc. SPIE 7101, Advances in Optical Thin Films III, 71011O (25 September 2008); doi: 10.1117/12.797627
Show Author Affiliations
A. Borshch, Institute of Physics (Ukraine)
M. Brodyn, Institute of Physics (Ukraine)
V. Volkov, Institute of Physics (Ukraine)
V. Lyakhovetski, Institute of Physics (Ukraine)
V. Rudenko, Institute of Physics (Ukraine)
A. Semenov, Institute of Monocrystals (Ukraine)
V. Pusikov, Institute of Monocrystals (Ukraine)

Published in SPIE Proceedings Vol. 7101:
Advances in Optical Thin Films III
Norbert Kaiser; Michel Lequime; H. Angus Macleod, Editor(s)

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