
Proceedings Paper
Morphology- and quantum-size induced oscillations of the electron-spin precession in Fe films on Ag(001)Format | Member Price | Non-Member Price |
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Paper Abstract
We report on spin-polarized electron reflection experiments on Fe films on Ag(001). Upon reflecting from the Fe film
the electron-spin polarization is found to vary in an oscillatory fashion as a function of the Fe thickness. Two different
periods are identified. While the long period is related to the occurrence of quantum-size effects in the Fe layer, the short
period of one monolayer is attributed to the periodic variations of the film morphology alternating between filled and
incompletely filled atomic layers. This shows - because of total angular momentum conservation - that the transfer of
spin-angular momentum from the incident electrons to the ferromagnetic film can be extremely sensitive to the
morphology and structure of the film.
Paper Details
Date Published: 4 September 2008
PDF: 7 pages
Proc. SPIE 7036, Spintronics, 703606 (4 September 2008); doi: 10.1117/12.797607
Published in SPIE Proceedings Vol. 7036:
Spintronics
Manijeh Razeghi; Henri-Jean M. Drouhin; Jean-Eric Wegrowe, Editor(s)
PDF: 7 pages
Proc. SPIE 7036, Spintronics, 703606 (4 September 2008); doi: 10.1117/12.797607
Show Author Affiliations
L. Tati-Bismaths, Institut de Physique et Chimie des Matériaux de Strasbourg, ULP, CNRS (France)
L. Joly, Paul Scherrer Institut, Swiss Light Source (Switzerland)
A. Bourzami, Institut de Physique et Chimie des Matériaux de Strasbourg, ULP, CNRS (France)
L. Joly, Paul Scherrer Institut, Swiss Light Source (Switzerland)
A. Bourzami, Institut de Physique et Chimie des Matériaux de Strasbourg, ULP, CNRS (France)
F. Scheurer, Institut de Physique et Chimie des Matériaux de Strasbourg, ULP, CNRS (France)
W. Weber, Institut de Physique et Chimie des Matériaux de Strasbourg, ULP, CNRS (France)
W. Weber, Institut de Physique et Chimie des Matériaux de Strasbourg, ULP, CNRS (France)
Published in SPIE Proceedings Vol. 7036:
Spintronics
Manijeh Razeghi; Henri-Jean M. Drouhin; Jean-Eric Wegrowe, Editor(s)
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