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Proceedings Paper

An equipment for spectral hemispherical reflectivity measurements of "water-polluted" samples
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Paper Abstract

Spectral Hemispherical Reflectance data, covering both VIS and SWIR wavebands, from 400 to 1800 nm, obtained by the investigation of laboratory controlled polluted water samples, are presented. In the frame of the article, the description of a dedicated equipment, consisting of a wide band illuminator based on a super quite Xenon lamp and a colour corrected NSF6-CaF2 objective, a dedicated tank, a custom integrating sphere coated with ZenithTM diffuser interfaced to a ASD Field Spec spectrometer, is given. With such an equipment, spectral hemispherical reflectivity data have been achieved on water samples, "polluted", under controlled conditions, with known quantities of oils, as examples of some typical oil pollutants of the marine environment. The experimental data obtained by means of the proposed apparatus, collected in a controlled way, allow to get fundamental measurement necessary to evaluate optical properties of liquids and materials to be used for optical modelling and spectral reflectance behaviour. Such a data are difficult to be achieved in literature in such a wide spectral range. They will serve to set up inversion algorithms for remote sensing applications. The wide variety of possible features that can be explored through the proposed equipment, jointed to its flexibility, constitute a reference point for future investigations on the characterisation of the reflectance properties of liquids.

Paper Details

Date Published: 27 September 2008
PDF: 12 pages
Proc. SPIE 7100, Optical Design and Engineering III, 71001L (27 September 2008);
Show Author Affiliations
M. Barilli, Selex Galileo Spa (Italy)
L. Chiarantini, Selex Galileo Spa (Italy)

Published in SPIE Proceedings Vol. 7100:
Optical Design and Engineering III
Laurent Mazuray; Jean-Luc Tissot; Jeffrey M. Raynor; Rolf Wartmann; Andrew Wood, Editor(s)

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