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Proceedings Paper

A simple system for measuring small phase retardation of an optical thin film
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Paper Abstract

This paper describes an experimental arrangement to determine phase retardations with changing signs around zero degree. In the experiment the phase retardation is caused by reflection from a non-periodic multilayer thin film reflector. A prism retarder is introduced in a common polarimetric measurement to act as a compensator in order to enable the measurement around zero degree phase retardation. Phase retardation within plus/minus a few degrees is measured in a broad spectral range using a fiber coupled spectrometer.

Paper Details

Date Published: 26 September 2008
PDF: 7 pages
Proc. SPIE 7101, Advances in Optical Thin Films III, 71011H (26 September 2008); doi: 10.1117/12.797180
Show Author Affiliations
T. N. Hansen, DELTA Light & Optics (Denmark)
H. Fabricius, DELTA Light & Optics (Denmark)

Published in SPIE Proceedings Vol. 7101:
Advances in Optical Thin Films III
Norbert Kaiser; Michel Lequime; H. Angus Macleod, Editor(s)

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