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Proceedings Paper

X-ray, gamma-ray detector/imager by CdTe semiconductor and its applications
Author(s): Toru Aoki; Hisashi Morii; Takuya Nakashima; Yasuyuki Takahashi; Gosuke Ohashi; Yasuhiro Tomita; Yoichiro Neo; Hidenori Mimura
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Paper Abstract

Photon counting type X-ray, gamma-ray detector and imager were developed by using CdTe compound semiconductor. The detector / imager could be applied for practical application and we tried to apply material identificated X-ray CT. The imager has photon energy discriminate function and high linearity between number of incident photons and output counts. It make high contrast image for X-ray penetration image and material identification in X-ray computed tomography (CT) measurement.

Paper Details

Date Published: 22 April 2008
PDF: 11 pages
Proc. SPIE 7008, Eighth International Conference on Correlation Optics, 70080R (22 April 2008); doi: 10.1117/12.796991
Show Author Affiliations
Toru Aoki, Shizuoka Univ. (Japan)
Hisashi Morii, Shizuoka Univ. (Japan)
Takuya Nakashima, Shizuoka Univ. (Japan)
Yasuyuki Takahashi, Shizuoka Univ. (Japan)
Gosuke Ohashi, Shizuoka Univ. (Japan)
Yasuhiro Tomita, Hamamatsu Photonics K.K. (Japan)
Yoichiro Neo, Shizuoka Univ. (Japan)
Hidenori Mimura, Shizuoka Univ. (Japan)

Published in SPIE Proceedings Vol. 7008:
Eighth International Conference on Correlation Optics
Malgorzata Kujawinska; Oleg V. Angelsky, Editor(s)

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