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Proceedings Paper

Spectral responses of virtual Frisch-grid CdZnTe detectors and their relation to IR microscopy and x-ray diffraction topography data
Author(s): A. E. Bolotnikov; S. Babalola; G. S. Camarda; Y. Cui; S. U. Egarievwe; P. M. Fochuk; R. Hawrami; A. Hossain; J. R. James; I. J. Nakonechnyj; Ge Yang; R. B. James
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Paper Abstract

Virtual Frisch-grid CdZnTe detectors potentially can provide energy resolution close to the statistical limit. However, in real detectors, the quality of the crystals used to fabricate the devices primarily determines energy resolution. In this paper, we report our findings on the spectral response of devices and their relation to material-characterization data obtained using IR microscopy and X-ray diffraction topography.

Paper Details

Date Published: 4 September 2008
PDF: 16 pages
Proc. SPIE 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X, 707903 (4 September 2008); doi: 10.1117/12.796232
Show Author Affiliations
A. E. Bolotnikov, Brookhaven National Lab. (United States)
S. Babalola, Fisk Univ. (United States)
Vanderbilt Univ. (United States)
G. S. Camarda, Brookhaven National Lab. (United States)
Y. Cui, Brookhaven National Lab. (United States)
S. U. Egarievwe, Fisk Univ. (United States)
P. M. Fochuk, Chernivtsi National Univ. (Ukraine)
R. Hawrami, Fisk Univ. (United States)
A. Hossain, Brookhaven National Lab. (United States)
J. R. James, Tennessee Technological Univ. (United States)
I. J. Nakonechnyj, Chernivtsi National Univ. (Ukraine)
Ge Yang, Brookhaven National Lab. (United States)
R. B. James, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 7079:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X
Arnold Burger; Larry A. Franks; Ralph B. James, Editor(s)

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