
Proceedings Paper
Optical properties of silver nanorod arrays prepared by oblique angle depositionFormat | Member Price | Non-Member Price |
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Paper Abstract
In this work, we use oblique incident deposition technique to fabricate silver nanorod arrays (NRA). It is found that the
orientation of nanorod growth does not obey the traditional tangent rule (empirical relation between the deposition angle
and column growth angle). The maximum Ag nanorods tilt angle with respect to the substrate normal can reach to 76
deg. The Ag nanorods almost lie on the substrate and the array behaves as a polarizer. The transmittance versus the
polarization direction of normal incident ray is presented in this paper. For a Ag nanorod array with thickness 220 nm
and nanorod tilt angle 76 deg, the extinction ratio at wavelength 632.8 nm becomes 0.12 that is better than previous
work. The extinction ratio of the polarizer would be further reduced to be less than 0.05 by arranging an isotropic Ag
film between the Ag nanorod array and the substrate. On the other hand, it is interesting to show that Ag nanorod array is
isotropic for normal incident ray with any polarization direction at a certain critical wavelength λc. In the wavelength
range λ>λc, the maximum absorption occurs when the polarization is TM mode (electric field direction parallel to the
deposition plane). In the wavelength range λ<λc, the maximum absorption occurs when the polarization is TE mode
(electric field direction perpendicular to the deposition plane). The critical wavelengths for Ag nanorod arrays fabricated
by different deposition angles are measured and analyzed in this paper.
Paper Details
Date Published: 10 September 2008
PDF: 8 pages
Proc. SPIE 7041, Nanostructured Thin Films, 704110 (10 September 2008); doi: 10.1117/12.795686
Published in SPIE Proceedings Vol. 7041:
Nanostructured Thin Films
Geoffrey B. Smith; Akhlesh Lakhtakia, Editor(s)
PDF: 8 pages
Proc. SPIE 7041, Nanostructured Thin Films, 704110 (10 September 2008); doi: 10.1117/12.795686
Show Author Affiliations
Yi-Jun Jen, National Taipei Univ. of Technology (Taiwan)
Wen-Lung Hsu, National Taipei Univ. of Technology (Taiwan)
Wen-Lung Hsu, National Taipei Univ. of Technology (Taiwan)
Ching-Wei Yu, National Taipei Univ. of Technology (Taiwan)
Published in SPIE Proceedings Vol. 7041:
Nanostructured Thin Films
Geoffrey B. Smith; Akhlesh Lakhtakia, Editor(s)
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