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Proceedings Paper

Determination of the noise characterization of MODIS thermal emissive bands for cold scene observations
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Paper Abstract

MODIS is a key instrument on-board both EOS Terra and Aqua satellites launched in December 1999 and May 2002, respectively. It has 16 thermal emissive bands (TEB) with a wavelength range from 3.5 to 14.4μm and 10 detectors in each band. The TEB detectors are located on cold focal plane assembles nominally controlled at 83K. TEB on-orbit calibration is performed for each band, detector and mirror side on a scan-by-scan basis with the dominant gain response determined through observations of a temperature controlled on-board blackbody (BB). The noise equivalent temperature difference (NEdT) is a key parameter to characterize the calibration uncertainty. Values of the NEdT are normally monitored at a fixed BB temperature of 285K for Aqua and 290K for Terra. Variations of NEdT with BB temperature are determined using the BB warmup/cooldown cycle scheduled every three months for a BB temperature range between 270 and 315K. In this study, we extend TEB detector NEdT characterization to temperatures below the BB temperature range. This approach uses detector responses to the interior of the instrument cavity, which varies in temperature between 210 and 270K depending on the viewing portion of the cavity inner surface. This study examines the stability of the cavity inner surface responses. Comparison of the NEdT obtained from cavity and BB measurements shows good agreement at the same temperature of 270K. Finally, the results of both Terra and Aqua NEdT determined from cavity measurements are presented.

Paper Details

Date Published: 20 August 2008
PDF: 9 pages
Proc. SPIE 7081, Earth Observing Systems XIII, 70810F (20 August 2008); doi: 10.1117/12.795270
Show Author Affiliations
Aisheng Wu, Science Systems and Applications, Inc. (United States)
Xiaoxiong Xiong, NASA Goddard Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 7081:
Earth Observing Systems XIII
James J. Butler; Jack Xiong, Editor(s)

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