Share Email Print

Proceedings Paper

Phase error correction for multiple planes using sharpness metrics
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Phase errors introduced in the object beam of a digital hologram degrade the image quality of the object. We present computer simulations showing the effect of multiple planes of phase errors in the propagation path. By using a nonlinear optimization technique to maximize sharpness metrics, we show results that account for aberrations in multiple planes and correct anisoplanatic blur. This paper demonstrates this technique for two and three phase screens.

Paper Details

Date Published: 26 August 2008
PDF: 6 pages
Proc. SPIE 7094, Unconventional Imaging IV, 709404 (26 August 2008); doi: 10.1117/12.795193
Show Author Affiliations
Abbie E. Tippie, Univ. of Rochester (United States)
James R. Fienup, Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 7094:
Unconventional Imaging IV
Jean J. Dolne; Thomas J. Karr; Victor L. Gamiz, Editor(s)

© SPIE. Terms of Use
Back to Top