
Proceedings Paper
Instantaneous phase-shift Fizeau interferometer utilizing a synchronous frequency shift mechanismFormat | Member Price | Non-Member Price |
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Paper Abstract
An on-axis, vibration insensitive, polarization Fizeau interferometer is realized through the use of a
pixelated polarization mask spatial carrier phase shifting technique in conjunction with a high
coherence source and a polarization frequency shift device. In this arrangement, differential motion
between the test and reference surfaces, in conjunction with the polarization frequency shift device, is
used to effectively separate the orthogonally polarized test and reference beam components for
interference. With both the test and the reference beams on-axis, the common path cancellation
advantages of the Fizeau interferometer are maintained. Additionally, the use of a high coherence
source eliminates the need to path match the test and reference arms of the interferometer. Using a 1
mW HeNe source, the optimum camera shutter speed, used when measuring a 4% reflector, was 250
usec, resulting in significantly reduced vibration sensitivity. Experimental results show the
performance of this new interferometer to be within the specifications of commercial phase shifting
interferometers.
Paper Details
Date Published: 11 August 2008
PDF: 11 pages
Proc. SPIE 7063, Interferometry XIV: Techniques and Analysis, 706307 (11 August 2008); doi: 10.1117/12.794864
Published in SPIE Proceedings Vol. 7063:
Interferometry XIV: Techniques and Analysis
Joanna Schmit; Katherine Creath; Catherine E. Towers, Editor(s)
PDF: 11 pages
Proc. SPIE 7063, Interferometry XIV: Techniques and Analysis, 706307 (11 August 2008); doi: 10.1117/12.794864
Show Author Affiliations
James Millerd, 4D Technology Corp. (United States)
Published in SPIE Proceedings Vol. 7063:
Interferometry XIV: Techniques and Analysis
Joanna Schmit; Katherine Creath; Catherine E. Towers, Editor(s)
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