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Proceedings Paper • Open Access

High-efficiency free-form nonimaging condenser overcoming rotational symmetry limitations
Author(s): Juan C. Miñano; Pablo Benítez; José Blen; Asunción Santamaría

Paper Abstract

The importance of condenser optics is the fact that it is the bottleneck limiting efficiency in commercially available projection systems. Conventional condensers use rotational symmetric devices, most of them being elliptic or parabolic mirrors. They perform very far from the theoretical limits for sources such as arc lamps or halogen bulbs. Typical small displays in the 5-15 mm2 etendue range have geometrical efficiencies about 40-50% for the best condensers; although theory allows about 100% (no reflection nor absorption losses are considered). The problem is in the coma aberration of the reflectors and the rotational symmetric image of the source making the source projected image to unfit with the target. Thus, the only way to improve this performance is to generate a free form design that is able to control the shape and rotation of the source projected images. As yet, this can only be done with the SMS3D design method. We present here one of such designs achieving a collection efficiency 1.8 times that of an elliptical condenser for a 4:1 target aspect ratio and for the range of target etendue with practical interest and 1.5 for 16:9 target. These designs use only 1 additional reflection, i.e., use a total of 2 reflections from the source to the target. A prototype of one type of free form condenser has already been built.

Paper Details

Date Published: 23 September 2008
PDF: 11 pages
Proc. SPIE 7103, Illumination Optics, 71030A (23 September 2008); doi: 10.1117/12.794259
Show Author Affiliations
Juan C. Miñano, Univ. Politécnica de Madrid (Spain)
LPI (United States)
Pablo Benítez, Univ. Politécnica de Madrid (Spain)
LPI (United States)
José Blen, LPI (United States)
Asunción Santamaría, Univ. Politécnica de Madrid (Spain)

Published in SPIE Proceedings Vol. 7103:
Illumination Optics
Tina E. Kidger; Stuart R. David, Editor(s)

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