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Proceedings Paper

Charge injecting layers for admittance spectroscopy
Author(s): M. Hoping; C. Schildknecht; H. Gargouri; T. Riedl; M. Tilgner; H.-H. Johannes; W. Kowalsky
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Paper Abstract

Admittance spectroscopy is a simple yet powerful tool to determine the carrier mobility of organic compounds. One requirement is to have an Ohmic contact for charge injection. By employing a thin interfacial layer of tungsten oxide or molybdenum oxide we have found a possibility to efficiently inject holes into organic materials with a deep highest occupied molecular orbital level down to 6.3 eV. These results considerably enhance the application range of the admittance spectroscopy method. The measured mobility data are in excellent agreement with data obtained by the time-of-flight technique. To efficiently inject electrons into materials with an ionization potential of up to 2.7 eV we thermally evaporated an intermediate layer of cesium carbonate and discuss the extracted electron mobilities.

Paper Details

Date Published: 2 September 2008
PDF: 12 pages
Proc. SPIE 7051, Organic Light Emitting Materials and Devices XII, 70511D (2 September 2008); doi: 10.1117/12.794180
Show Author Affiliations
M. Hoping, Technische Univ. Braunschweig (Germany)
C. Schildknecht, BASF Societas Europaea (Germany)
H. Gargouri, Technische Univ. Braunschweig (Germany)
T. Riedl, Technische Univ. Braunschweig (Germany)
M. Tilgner, Technische Univ. Braunschweig (Germany)
H.-H. Johannes, Technische Univ. Braunschweig (Germany)
W. Kowalsky, Technische Univ. Braunschweig (Germany)

Published in SPIE Proceedings Vol. 7051:
Organic Light Emitting Materials and Devices XII
Franky So; Chihaya Adachi, Editor(s)

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