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Proceedings Paper

The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA)
Author(s): Alexander Rack; Heinrich Riesemeier; Simon Zabler; Timm Weitkamp; Bernd R. Müller; Gerd Weidemann; Peter Modregger; John Banhart; Lukas Helfen; Andreas N. Danilewsky; Hans G. Gräber; Richard Heldele; Boaz Mayzel; Jürgen Goebbels; Tilo Baumbach
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Paper Abstract

The BAMline at the BESSY light source in Berlin and the TopoTomo beamline at the ANKA synchrotron facility in Karlsruhe (both Germany) operate in the hard X-ray regime (above 6 keV) with similiar photon flux density. For typical imaging applications, a double multilayer monochromator or a filtered white beam is used. In order to optimise the field of view and the resolution of the available indirect pixel detectors, different optical systems have been installed, adapted, respectively, to a large field of view (macroscope) and to high spatial resolution (microscope). They can be combined with different camera systems, ranging from 16-bit dynamic range slow-scan CCDs to fast CMOS cameras. The spatial resolution can be brought substantially beyond the micrometer limit by using a Bragg magnifier. The moderate flux of both beamlines compared to other 3rd generation light sources is compensated by a dedicated scintillator concept. For selected applications, X-ray beam collimation has proven to be a reliable approach to increase the available photon flux density. Absorption contrast, phase contrast, holotomography and refraction-enhanced imaging are used depending on the application. Additionally, at the TopoTomo beamline digital white beam synchrotron topography is performed, using the digital X-ray pixel detectors installed.

Paper Details

Date Published: 16 September 2008
PDF: 9 pages
Proc. SPIE 7078, Developments in X-Ray Tomography VI, 70780X (16 September 2008); doi: 10.1117/12.793721
Show Author Affiliations
Alexander Rack, Forschungszentrum Karlsruhe GmbH (Germany)
Heinrich Riesemeier, Federal Inst. for Materials Research and Testing (Germany)
Simon Zabler, Max-Planck-Inst. of Colloids and Interfaces (Germany)
Timm Weitkamp, Forschungszentrum Karlsruhe GmbH (Germany)
European Synchrotron Radiation Facility (France)
Bernd R. Müller, Federal Inst. for Materials Research and Testing (Germany)
Gerd Weidemann, Federal Inst. for Materials Research and Testing (Germany)
Peter Modregger, Forschungszentrum Karlsruhe GmbH (Germany)
John Banhart, Hahn-Meitner-Institut Berlin GmbH (Germany)
Lukas Helfen, Forschungszentrum Karlsruhe GmbH (Germany)
Andreas N. Danilewsky, Albert-Ludwigs-Univ. Freiburg (Germany)
Hans G. Gräber, Rheinisch Westfälische Technische Hochschule (Germany)
Richard Heldele, Forschungszentrum Karlsruhe GmbH (Germany)
Boaz Mayzel, Tel Aviv Univ. (Israel)
Jürgen Goebbels, Federal Inst. for Materials Research and Testing (Germany)
Tilo Baumbach, Forschungszentrum Karlsruhe GmbH (Germany)

Published in SPIE Proceedings Vol. 7078:
Developments in X-Ray Tomography VI
Stuart R. Stock, Editor(s)

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