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Proceedings Paper

Characterization of new metallized polyimide films with high electrooptical performances
Author(s): Saule K. Kudaikulova; Rinat M. Iskakov; Irina V. Razumovskaja; Sergei L. Bazhenov; Vladimir N. Koptsev; Oleg Y. Prikhodko; Andrei P. Kurbatov; Tleuken Z. Akhmetov; Bulat A. Zhubanov; Marc J. M. Abadie
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Paper Abstract

The specific properties and structure of new chemically metallized polyimides films were investigated by RSA, DSK, TGA methods and by measurements of the microhardness, reflectivity and the electrical conductivity. The surface layers represent composite material in which metal nanoparticles strengthen the polymer. The method of microhardness can be used as express-method for estimation the depth of metal particle penetration. The value of the electrical conductivity permits to estimate the thickness of "high conductivity" owing to impurities after chemical modification. The high adhesion and reflection coefficient in visible spectrum part, caused by the specific structure, makes these films prospective for new technicues.

Paper Details

Date Published: 5 March 2008
PDF: 12 pages
Proc. SPIE 7009, Second International Conference on Advanced Optoelectronics and Lasers, 700914 (5 March 2008); doi: 10.1117/12.793449
Show Author Affiliations
Saule K. Kudaikulova, Institute of Chemical Sciences (Kazakhstan)
Rinat M. Iskakov, Institute of Chemical Sciences (Kazakhstan)
Irina V. Razumovskaja, Moscow State Pedagogical Univ. (Russia)
Sergei L. Bazhenov, Moscow State Pedagogical Univ. (Russia)
Vladimir N. Koptsev, Moscow State Pedagogical Univ. (Russia)
Oleg Y. Prikhodko, Al-Farabi Kazakh National State Univ. (Kazakhstan)
Andrei P. Kurbatov, Al-Farabi Kazakh National State Univ. (Kazakhstan)
Tleuken Z. Akhmetov, Al-Farabi Kazakh National State Univ. (Kazakhstan)
Bulat A. Zhubanov, Institute of Chemical Sciences (Kazakhstan)
Marc J. M. Abadie, Montpellier Univ. 2 (France)

Published in SPIE Proceedings Vol. 7009:
Second International Conference on Advanced Optoelectronics and Lasers
Igor A. Sukhoivanov; Vasily A. Svich; Yuriy S. Shmaliy, Editor(s)

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