
Proceedings Paper
Method of focusing laser beam based on analysis of spatial frequencies of surface imageFormat | Member Price | Non-Member Price |
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Paper Abstract
The method of a focusing objective, spatial spectrum, based on the analysis, of images is circumscribed. The theoretical
substantiation is shown it. Is shown, that for a surface of any object exists of one or several resonant spatial frequencies,
which in a focal point have maximum intensity. It is connected to a method of formation of a roughness. Because of
theories of stochastic and random oscillations, is asserted, that all actual rough surfaces are not absolute random in a
sense of a theory of probabilities. Therefore, optical fields generated by these objects, too not random. The image in this
case grows out interactions of a field with a screen. Such submission has allowed to use as the characteristic of an optical
field correlation dimensionality of its spatial chaos. The conducted researches have allowed to combine process of
precision guidance on a focal point of the technological laser with obtaining of a sharp image of a treated surface.
Paper Details
Date Published: 5 March 2008
PDF: 8 pages
Proc. SPIE 7009, Second International Conference on Advanced Optoelectronics and Lasers, 70090U (5 March 2008); doi: 10.1117/12.793396
Published in SPIE Proceedings Vol. 7009:
Second International Conference on Advanced Optoelectronics and Lasers
Igor A. Sukhoivanov; Vasily A. Svich; Yuriy S. Shmaliy, Editor(s)
PDF: 8 pages
Proc. SPIE 7009, Second International Conference on Advanced Optoelectronics and Lasers, 70090U (5 March 2008); doi: 10.1117/12.793396
Show Author Affiliations
M. Dzjubenko, Usikov Institute of Radio Physics and Electronics (Ukraine)
S. Kolpakov, Usikov Institute of Radio Physics and Electronics (Ukraine)
S. Kolpakov, Usikov Institute of Radio Physics and Electronics (Ukraine)
O. Priyomko, Usikov Institute of Radio Physics and Electronics (Ukraine)
D. Kulishenko, Usikov Institute of Radio Physics and Electronics (Ukraine)
D. Kulishenko, Usikov Institute of Radio Physics and Electronics (Ukraine)
Published in SPIE Proceedings Vol. 7009:
Second International Conference on Advanced Optoelectronics and Lasers
Igor A. Sukhoivanov; Vasily A. Svich; Yuriy S. Shmaliy, Editor(s)
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