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Proceedings Paper

Reflectivity of a glass thin film with different nanostructures
Author(s): Haining Wang; Shengli Zou
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Paper Abstract

We investigate the reflectivity of glass thin films with different nanostructures using electromagnetic theory. The Discrete Dipole Approximation (DDA) method is used in the calculations. The thickness of the film is varied from 50 to 200 nm. Films composed of semi-ellipsoid, cylinder, and prism particle arrays are examined in order to understand the structure dependence of the thin film reflectivity at nanoscale level. When the film thickness is 50 nm, films with effective dielectric constant gradient exhibit lower reflectivity than those with the uniform dielectric constant. At short wavelengths, the thin film nanostructure has a significant influence to its reflectivity. For longer ones, especially when the wavelength is much larger than the film thickness, the effect of the nanostructure becomes less important and the volume of the film evolves to be an important factor. We also explore the reflectivity of glass films including a 100 nm thick solid substrate layer and nanostructures of different heights. For a film with semi-ellipsoid arrays of the same thickness, its reflectivity drops with the increase of the semi-ellipsoid diameter. The simulation results can be of help in the design of thin film solar cell coating for the enhancement of solar energy conversion efficiency.

Paper Details

Date Published: 28 August 2008
PDF: 7 pages
Proc. SPIE 7033, Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV, 70331S (28 August 2008); doi: 10.1117/12.793264
Show Author Affiliations
Haining Wang, Univ. of Central Florida (United States)
Shengli Zou, Univ. of Central Florida (United States)

Published in SPIE Proceedings Vol. 7033:
Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV
Satoshi Kawata; Vladimir M. Shalaev; Din Ping Tsai, Editor(s)

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