Share Email Print

Proceedings Paper

Adaptive acquisition geometry for micro-CT with large format detectors
Author(s): Alexander Sasov; Faisal Nadeem; Xuan Liu; Koen Verelst
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Reconstruction theory requires that an object should be fully inside the field of view (FOV) of the scanning geometry. This implies that the number of pixels in the detector determines the smallest resolvable details for a given FOV size. Many commercially available micro-CT scanners use a 1-megapixel cameras with 1K pixels in horizontal direction, which can resolve features of 1/1000 of the FOV size. Using a large format detector and a few offset positions will increase imaging resolution, but will also dramatically reduces number of X-ray photons collected per pixel. To improve acquisition efficiency without compromising scanning time, we developed and implemented in commercially produced SkyScan-1172 scanners an adaptive geometry approach. To achieve a chosen magnification, the distances between x-ray source, detector and object are adjusted automatically to most compact geometry with maximum use of X-ray. This adaptive geometry improves significantly the acquisition speed for a large range of magnifications and allows using 10+ megapixels detectors instead of detectors with 1-2 megapixels. Flexible acquisition geometry also opens possibility to use phase-contrast enhancement for improvement in spatial resolution.

Paper Details

Date Published: 18 September 2008
PDF: 8 pages
Proc. SPIE 7078, Developments in X-Ray Tomography VI, 70781Q (18 September 2008); doi: 10.1117/12.793203
Show Author Affiliations
Alexander Sasov, SkyScan (Belgium)
Faisal Nadeem, SkyScan (Belgium)
Xuan Liu, SkyScan (Belgium)
Koen Verelst, SkyScan (Belgium)

Published in SPIE Proceedings Vol. 7078:
Developments in X-Ray Tomography VI
Stuart R. Stock, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?