Proceedings Paper
Growth of highly (h00) oriented barium strontium titanate films on silicon substrates using conducting LaNiO3 electrode| Format | Member Price | Non-Member Price |
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Paper Abstract
(Ba,Sr)TiO3 (BST) thin films were deposited on the conducting perovskite LaNiO3 electrode by radio-frequency (rf)
magnetron sputtering technique. To investigate the crystalline of BST films, the substrate temperatures (Td) in the range
of 100°C-700°C were applied. The transition from amorphous phase to polycrystalline phase for the films occurred at
low growth temperature 300°C. When the growth temperature approached 500°C, highly (h00)-oriented films were
obtained. The relative dielectric constant (εr) increased rapidly with enhancing growth temperature because of improved
crystallinity, and showed slowly increase above 500°C. In addition, the capacitance-voltage characteristics were studied
with various growth temperatures. The tunability increased largely with good crystallinity. This can be attributed to
increased dielectric constants.
Paper Details
Date Published: 11 March 2008
PDF: 4 pages
Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 698414 (11 March 2008); doi: 10.1117/12.793167
Published in SPIE Proceedings Vol. 6984:
Sixth International Conference on Thin Film Physics and Applications
Wenzhong Shen; Junhao Chu, Editor(s)
PDF: 4 pages
Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 698414 (11 March 2008); doi: 10.1117/12.793167
Show Author Affiliations
Y. H. Gao, Shanghai Institute of Technical Physics (China)
J. H. Ma, Shanghai Institute of Technical Physics (China)
J. L. Sun, Shanghai Institute of Technical Physics (China)
J. H. Ma, Shanghai Institute of Technical Physics (China)
J. L. Sun, Shanghai Institute of Technical Physics (China)
X. J. Meng, Shanghai Institute of Technical Physics (China)
J. H. Chu, Shanghai Institute of Technical Physics (China)
J. H. Chu, Shanghai Institute of Technical Physics (China)
Published in SPIE Proceedings Vol. 6984:
Sixth International Conference on Thin Film Physics and Applications
Wenzhong Shen; Junhao Chu, Editor(s)
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