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Proceedings Paper

Free modulation of defect states in multilayer structures consisting of epsilon-negative material and mu-negative material
Author(s): Qiong Wang; Changchun Yan; Lingling Zhang; Yiping Cui
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Paper Abstract

By means of introducing defect layers into multilayer structures composed by epsilon-negative material and mu-negative material, the free modulation of single and double localized modes in zero-φeff gap is realized respectively through adjusting the thickness of different kinds of defect layers in two designed structures. In addition, the defect modes in the zero-φeff gap, being distinct from those in the Bragg gap, have the property of insensitivity to incident angle and polarization in some degree, which would be applied widely in tunable omnidirectional filters.

Paper Details

Date Published: 11 March 2008
PDF: 4 pages
Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 69843S (11 March 2008); doi: 10.1117/12.792246
Show Author Affiliations
Qiong Wang, Southeast Univ. (China)
Changchun Yan, Southeast Univ. (China)
Lingling Zhang, Southeast Univ. (China)
Yiping Cui, Southeast Univ. (China)

Published in SPIE Proceedings Vol. 6984:
Sixth International Conference on Thin Film Physics and Applications
Wenzhong Shen; Junhao Chu, Editor(s)

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