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Proceedings Paper

Simultaneous geometry and color texture acquisition using a single-chip color camera
Author(s): Song Zhang; Shing-Tung Yau
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Paper Abstract

Capturing 3-D geometry and the perfectly aligned color texture simultaneously is crucial for diverse fields including entertainment, target recognition, and computer graphics. However, it is very challenging for a conventional technique because of a number of problems related to color. Previous researchers rely heavily on using two cameras: a black-and-white(B/W) camera to measure the geometry, and a color camera to capture the color texture. However, aligning the color image with the 3-D geometry point by point remains difficult. In this research, we propose a novel technique that uses a single-chip color camera to capture both geometry and color texture simultaneously. A projector projects B/W fringe patterns onto the object, and a color camera captures the raw fringe images with Bayer mosaic patterns. A phase-shifting algorithm is used for our system because of one of its merits: retrieving phase pixel-by-pixel. Therefore, the intensity variations between neighboring pixels do not significantly affect the measurement. Moreover, the same set of fringe images is also used to calculate the B/W texture image, which is further converted into a color image using a demosaicing algorithm. Therefore, the same set of fringe images are used to generate the 3-D geometry as well as the color texture image simultaneously. A hardware system was developed to verify the performance of the proposed technique. Experiments demonstrated that this technique can successfully measure both geometry and color texture of the color objects.

Paper Details

Date Published: 11 August 2008
PDF: 8 pages
Proc. SPIE 7063, Interferometry XIV: Techniques and Analysis, 70630M (11 August 2008); doi: 10.1117/12.792003
Show Author Affiliations
Song Zhang, Iowa State Univ. (United States)
Shing-Tung Yau, Harvard Univ. (United States)

Published in SPIE Proceedings Vol. 7063:
Interferometry XIV: Techniques and Analysis
Joanna Schmit; Katherine Creath; Catherine E. Towers, Editor(s)

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