
Proceedings Paper
Design of a three field-of-view IR systemFormat | Member Price | Non-Member Price |
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Paper Abstract
The design method and result are described for an infrared zoom system with three fields of view. Its zoom
ratio is 9, and the corresponding field of view is 3°~27°. The working waveband is from 3μm to 5μm, and its total
length is required to be no more than 400mm. The final optical system consists of 9 elements, with two aspheric
surfaces and a diffractive optical element. It achieves diffraction-limited imaging at the middle infrared waveband.
From the last result we can know using the diffractive optical elements can eliminate the color aberration and helps
to reduce the cost of the system; and using the rotated elements in the system it is easy to change the field-of-view
and satisfied the cooled detector requirements.
Paper Details
Date Published: 12 March 2008
PDF: 7 pages
Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66241S (12 March 2008); doi: 10.1117/12.791186
Published in SPIE Proceedings Vol. 6624:
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing
Liwei Zhou, Editor(s)
PDF: 7 pages
Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66241S (12 March 2008); doi: 10.1117/12.791186
Show Author Affiliations
Jun Chang, Beijing Institute of Technology (China)
Zhicheng Weng, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Yongtian Wang, Beijing Institute of Technology (China)
Zhicheng Weng, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Yongtian Wang, Beijing Institute of Technology (China)
Huilin Jiang, Changchun Univ. of Science and Technology (China)
Xiaojie Cong, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Xiaojie Cong, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Published in SPIE Proceedings Vol. 6624:
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing
Liwei Zhou, Editor(s)
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