
Proceedings Paper
Application of a high-precision interferometric measuring system as phasing the segmented primary mirrors of the next generation of ground-based telescopeFormat | Member Price | Non-Member Price |
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Paper Abstract
Optical telescope systems with segmented mirrors require precise coalignment of their segments to achieve the
desired full near-diffraction-limit performance. The segment vertical misalignment (piston error) between the
segments must be reduced to a small fraction of the wavelength (<100nm) of incoming light. We have considered
an interferometric piston error measurement system based on a high-aperture Michelson interferometer layout for
accomplishing such objectives, The piston error between the segments can be extracted from the interferometric
fringes mismatching, The innovation introduced in the optical design of the interferometer is the simultaneous use
of monochromatic light and two-wavelength combination white-light source in a direct method for improving the
central fringe identification in the white-light interferometric phasing system. We find that this two-wavelength
combination technique can greatly increase the visibility difference between the central fringe and its adjacent side
fringes, and thus it offers an increased signal resolution. So make the central fringe identification become easier,
and enhance the measure precision of the segment phasing error. As a result, it is suitable for high-precision
measurement purpose and application in the segment piston error phasing system.
Paper Details
Date Published: 12 March 2008
PDF: 11 pages
Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66241I (12 March 2008); doi: 10.1117/12.791138
Published in SPIE Proceedings Vol. 6624:
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing
Liwei Zhou, Editor(s)
PDF: 11 pages
Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66241I (12 March 2008); doi: 10.1117/12.791138
Show Author Affiliations
Helun Song, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Hao Xian, Institute of Optics and Electronics (China)
Wenhan Jiang, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Hao Xian, Institute of Optics and Electronics (China)
Wenhan Jiang, Institute of Optics and Electronics (China)
Changhui Rao, Institute of Optics and Electronics (China)
Jian Huang, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Jian Huang, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Published in SPIE Proceedings Vol. 6624:
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing
Liwei Zhou, Editor(s)
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