
Proceedings Paper
Optical measuring system for defects of artillery lumenFormat | Member Price | Non-Member Price |
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Paper Abstract
At present, some method to measure the defects of artillery lumen has less automation and objectivity, and the other is
designed complicatedly and has low efficiency. So the optical measuring system for defects of artillery lumen is
developed. The system is made up of a cone-shaped lamp-house, a CCD camera and a mechanism to center and support
them, and so on. Whereas the imaging system is nonlinear, there exists geometric distortion on the original image of the
artillery lumen. So the pixel coordinate transformation and brightness interpolation are introduced to rectify the
geometric distortion of the image and the non-distortion image of the whole artillery lumen surface is gotten. Then the
methods such as segmenting, distilling, and area calculating are employed to measure the defects on the rectified image.
The experiments prove that the system can measure the defects effectively and rapidly. The precision can be advanced
more if the error factors are ameliorated and the methods to compensate the errors are adopted. The measuring precision
of the defects area can reach 0.5 mm2.
Paper Details
Date Published: 12 March 2008
PDF: 9 pages
Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66240G (12 March 2008); doi: 10.1117/12.791067
Published in SPIE Proceedings Vol. 6624:
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing
Liwei Zhou, Editor(s)
PDF: 9 pages
Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66240G (12 March 2008); doi: 10.1117/12.791067
Show Author Affiliations
Wenjuan Zhu, Beijing Institute of Technology (China)
Chunguang Xu, Beijing Institute of Technology (China)
Chunguang Xu, Beijing Institute of Technology (China)
Dingguo Xiao, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 6624:
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing
Liwei Zhou, Editor(s)
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