Share Email Print

Proceedings Paper

OTF compensation in structured illumination superresolution images
Author(s): Sapna A. Shroff; James R. Fienup; David R. Williams
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The lateral resolution of an imaging system is limited by its numerical aperture and the wavelength. Structured illumination incident on the object heterodynes the higher spatial frequencies of the object with the spatial frequency of the sinusoidal illumination into the passband of the imaging system providing lateral superresolution. This idea has been implemented in microscopy. Multiple images of an object are taken, with distinct phase shifts in the sinusoidally patterned illumination. They are processed to separate the conventional, un-aliased object spatial frequencies from the aliased ones, which contain superresolution information. The separated aliased terms are de-aliased (i.e. the spatial frequencies in them are moved to their correct locations in Fourier space) giving superresolution along the direction perpendicular to the orientation of the sinusoidal fringe pattern. This process is repeated with, say, 60° and 120° rotation of the sinusoidal fringe illumination to obtain superresolution in all directions. The final reconstructed image can be obtained by appropriate combination of the de-aliased superresolution components with the conventional, un-aliased components. We discuss the signal-to-noise ratio (SNR) and optical transfer function (OTF) compensation in the combination of all these components to obtain an image with lateral superresolution.

Paper Details

Date Published: 26 August 2008
PDF: 11 pages
Proc. SPIE 7094, Unconventional Imaging IV, 709402 (26 August 2008); doi: 10.1117/12.791052
Show Author Affiliations
Sapna A. Shroff, Univ. of Rochester (United States)
James R. Fienup, Univ. of Rochester (United States)
David R. Williams, Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 7094:
Unconventional Imaging IV
Jean J. Dolne; Thomas J. Karr; Victor L. Gamiz, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?