
Proceedings Paper
Numerical simulation of polarized bidirectional reflectance distribution function (BRDF) based on micro-facet modelFormat | Member Price | Non-Member Price |
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Paper Abstract
The polarized light scattered by the surface of a material contains information that can be used to describe the properties
of the surface. Polarized Bidirectional Reflectance Distribution Function (BRDF) is one of the most important factors
used to represent the property of the surface. It uses a 4×4 matrix (Mueller matrix) to describe the properties of the light
scattered from the surface. A polarized BRDF model based on the micro-facet theory is used in the numerical
simulation. The optical constant parameters contained in the model is derived from the experimental data through genetic
algorithm. Comparison between the model calculation and the experimental data shows that this model agrees well with
the experimental data, and can be used in the future work.
Paper Details
Date Published: 22 February 2008
PDF: 8 pages
Proc. SPIE 6622, International Symposium on Photoelectronic Detection and Imaging 2007: Laser, Ultraviolet, and Terahertz Technology, 66220A (22 February 2008); doi: 10.1117/12.790729
Published in SPIE Proceedings Vol. 6622:
International Symposium on Photoelectronic Detection and Imaging 2007: Laser, Ultraviolet, and Terahertz Technology
Liwei Zhou, Editor(s)
PDF: 8 pages
Proc. SPIE 6622, International Symposium on Photoelectronic Detection and Imaging 2007: Laser, Ultraviolet, and Terahertz Technology, 66220A (22 February 2008); doi: 10.1117/12.790729
Show Author Affiliations
Weiwei Feng, Anhui Institute of Optics and Fine Mechanics (China)
Qingnong Wei, Anhui Institute of Optics and Fine Mechanics (China)
Shimei Wang, Anhui Institute of Optics and Fine Mechanics (China)
Shisheng Liu, Anhui Institute of Optics and Fine Mechanics (China)
Qingnong Wei, Anhui Institute of Optics and Fine Mechanics (China)
Shimei Wang, Anhui Institute of Optics and Fine Mechanics (China)
Shisheng Liu, Anhui Institute of Optics and Fine Mechanics (China)
Dexia Wu, Anhui Institute of Optics and Fine Mechanics (China)
Zengdong Liu, Anhui Institute of Optics and Fine Mechanics (China)
Dongfang Wang, Anhui Institute of Optics and Fine Mechanics (China)
Zengdong Liu, Anhui Institute of Optics and Fine Mechanics (China)
Dongfang Wang, Anhui Institute of Optics and Fine Mechanics (China)
Published in SPIE Proceedings Vol. 6622:
International Symposium on Photoelectronic Detection and Imaging 2007: Laser, Ultraviolet, and Terahertz Technology
Liwei Zhou, Editor(s)
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