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Proceedings Paper

System design of submillimeter-wave imaging array SISCAM
Author(s): H. Matsuo; Y. Hibi; H. Nagata; M. Nakahashi; Y. Murakoshi; H. Arai; S. Ariyoshi; C. Otani; H. Ikeda; M. Fujiwara
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Paper Abstract

Developments on large format array of superconducting tunnel junction detectors are discussed and recent activities in readout electronics developments and focal plane optics designs are presented. We have been working on submillimeter-wave SIS photon detectors at 650 GHz using niobium tunnel junctions, which have high sensitivity, large dynamic range and fast response. Here we discuss on an implementation plan of large format array with cryogenic readout electronics and compact focal plane optics design. GaAs-JFETs operate at less than 1 K with low noise, low power dissipation and fast response. We have demonstrated operation of cryogenic integrating amplifiers and digital electronics for SIS photon detectors with multiplexed readout. Combined with compact focal plane optics, we now have a conceptual design of large format array of SIS photon detectors in submillimeter-wave. Further development to realize higher sensitivity superconducting tunnel junction detectors with extremely low leakage current are foreseen.

Paper Details

Date Published: 19 July 2008
PDF: 9 pages
Proc. SPIE 7020, Millimeter and Submillimeter Detectors and Instrumentation for Astronomy IV, 702015 (19 July 2008); doi: 10.1117/12.790615
Show Author Affiliations
H. Matsuo, National Astronomical Observatory of Japan (Japan)
Y. Hibi, National Astronomical Observatory of Japan (Japan)
H. Nagata, Japan Aerospace Exploration Agency (Japan)
M. Nakahashi, Toho Univ. (Japan)
Y. Murakoshi, Toho Univ. (Japan)
H. Arai, Toho Univ. (Japan)
S. Ariyoshi, RIKEN (Japan)
C. Otani, RIKEN (Japan)
H. Ikeda, Japan Aerospace Exploration Agency (Japan)
M. Fujiwara, National Institute of Information and Communications Technology (Japan)

Published in SPIE Proceedings Vol. 7020:
Millimeter and Submillimeter Detectors and Instrumentation for Astronomy IV
William D. Duncan; Wayne S. Holland; Stafford Withington; Jonas Zmuidzinas, Editor(s)

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