
Proceedings Paper
Adaptive optics for the CHARA ArrayFormat | Member Price | Non-Member Price |
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Paper Abstract
The efficiency of the CHARA Array has proven satisfactory for the scientific programs enabled by the first-generation
beam combination and detector systems. With multi-beam combination and more ambitious scientific goals,
improvements in throughput and efficiency will be highly leveraged. Engineering data from several years of nightly
operations are used to infer atmospheric characteristics and raw instrumental visibility in both classic optical and single-
mode fiber beam combiners. This information is the basis for estimates of potential gains that could be afforded by the
implementation of adaptive optics. This includes reduction of static and quasi-static aberrations, reduction of residual
tilt error, compensation for differential atmospheric refraction, reduction of diffractive beam propagation losses, each
leading to improved flux throughput and instrumental visibility, and to associated gains in operability and scientific
productivity.
Paper Details
Date Published: 28 July 2008
PDF: 7 pages
Proc. SPIE 7013, Optical and Infrared Interferometry, 70133B (28 July 2008); doi: 10.1117/12.790230
Published in SPIE Proceedings Vol. 7013:
Optical and Infrared Interferometry
Markus Schöller; William C. Danchi; Françoise Delplancke, Editor(s)
PDF: 7 pages
Proc. SPIE 7013, Optical and Infrared Interferometry, 70133B (28 July 2008); doi: 10.1117/12.790230
Show Author Affiliations
Stephen T. Ridgway, NOAO (United States)
Harold A. McAlister, CHARA (United States)
Theo ten Brummelaar, CHARA (United States)
Antoine Merand, CHARA (United States)
Harold A. McAlister, CHARA (United States)
Theo ten Brummelaar, CHARA (United States)
Antoine Merand, CHARA (United States)
Judit Sturmann, CHARA (United States)
Laszlo Sturmann, CHARA (United States)
Nils Turner, CHARA (United States)
Laszlo Sturmann, CHARA (United States)
Nils Turner, CHARA (United States)
Published in SPIE Proceedings Vol. 7013:
Optical and Infrared Interferometry
Markus Schöller; William C. Danchi; Françoise Delplancke, Editor(s)
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