Share Email Print

Proceedings Paper

High-contrast imaging with Keck adaptive optics and OSIRIS
Author(s): Michael McElwain; James Larkin; Stanimir Metchev; Benjamin Zuckerman
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

While more than 200 extrasolar planets have been discovered using indirect techniques, the direct detection of this class of object has remained at the sensitivity limits of ground based observatories. The development of improved adaptive optics systems and high contrast instruments has increased the sensitivity to extrasolar planets. We present high contrast results from the OSIRIS infrared lenslet-based integral field spectrograph (IFS) operating behind the Keck II adaptive optics (AO) system. OSIRIS spatially samples the Keck PSF at the diffraction limit, while providing a spectral resolution of 3800 for each spaxel. The OSIRIS integral field sampling simultaneously monitors the PSF over a broad band (20%), and this sampling is used to identify and suppress speckle diffraction features. The high-contrast sensitivity of Keck II AO near-infrared IFS (OSIRIS) and near-infrared imager (NIRC2) are compared.

Paper Details

Date Published: 11 July 2008
PDF: 12 pages
Proc. SPIE 7015, Adaptive Optics Systems, 70151A (11 July 2008); doi: 10.1117/12.790201
Show Author Affiliations
Michael McElwain, Princeton Univ. (United States)
James Larkin, Univ. of California, Los Angeles (United States)
Stanimir Metchev, Univ. of California, Los Angeles (United States)
Benjamin Zuckerman, Univ. of California, Los Angeles (United States)

Published in SPIE Proceedings Vol. 7015:
Adaptive Optics Systems
Norbert Hubin; Claire E. Max; Peter L. Wizinowich, Editor(s)

© SPIE. Terms of Use
Back to Top