
Proceedings Paper
Wide-field imaging interferometry testbed (WIIT): image construction algorithmsFormat | Member Price | Non-Member Price |
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Paper Abstract
The Wide-Field Imaging Interferometry Testbed (WIIT) is a wide-field spectral imaging Michelson
interferometer designed and developed at the NASA/Goddard Space Flight Center. WIIT is now
operational and is being used to demonstrate imaging and spectroscopy over fields-of-view larger than the
typically narrow primary beam footprint of a conventional Michelson interferometer. At the heart of this
technique is the "double-Fourier" approach whereby the apertures and a delay line are both moved to
collect interferograms over a 2D wide field detector grid simultaneously; one interferogram per detector
pixel. This aggregate set of interferograms, as a function of baseline and delay line, is algorithmically
processed to construct a hyperspectral image cube. Herein is developed and discussed the algorithm that
constructs the image cube. We show our preliminary results using observed laboratory WIIT data and
discuss our ongoing work for image deconvolution.
Paper Details
Date Published: 28 July 2008
PDF: 11 pages
Proc. SPIE 7013, Optical and Infrared Interferometry, 70131M (28 July 2008); doi: 10.1117/12.789833
Published in SPIE Proceedings Vol. 7013:
Optical and Infrared Interferometry
Markus Schöller; William C. Danchi; Françoise Delplancke, Editor(s)
PDF: 11 pages
Proc. SPIE 7013, Optical and Infrared Interferometry, 70131M (28 July 2008); doi: 10.1117/12.789833
Show Author Affiliations
Richard G. Lyon, NASA Goddard Space Flight Ctr. (United States)
Stephen A. Rinehart, NASA Goddard Space Flight Ctr. (United States)
Stephen A. Rinehart, NASA Goddard Space Flight Ctr. (United States)
David T. Leisawitz, NASA Goddard Space Flight Ctr. (United States)
Nargess Memarsadeghi, NASA Goddard Space Flight Ctr. (United States)
Nargess Memarsadeghi, NASA Goddard Space Flight Ctr. (United States)
Published in SPIE Proceedings Vol. 7013:
Optical and Infrared Interferometry
Markus Schöller; William C. Danchi; Françoise Delplancke, Editor(s)
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